ATPG
From Wikipedia, the free encyclopedia.

Automatic test pattern generation (ATPG) systems are tools for generating tests for digital circuits after they are produced.

Testing very-large-scale integrated circuits with a high fault coverage is a hard task because of their complexity. Different ATPG methods have to be applied to combinatorial and sequential circuits.

See also:

• Design for Test (DFT)
• Fault model
• ASIC
• VHSIC

The original article can be found at: http://en.wikipedia.org/wiki/ATPG.
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